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Technical Paper Semiconductors APCSM October 2022

Automated, fast, multi-timescale, Time Series AI

In industrial settings—from semiconductor fabrication to oil, gas, and metal production—modern equipment generates trillions of measurements daily, far exceeding the capacity of human analysis and conventional heuristics. To address this, we present “Time Series AI,” a novel, deep-learning-based approach for scalable, unsupervised anomaly detection in complex industrial time series data.

Unlike traditional methods that rely on labor-intensive manual rule creation and univariate statistics, Time Series AI leverages Convolutional Variational Autoencoders (CVAE) to automatically characterize sensor traces and identify anomalies. By defining an anomaly as the “residual difficulty” the model faces in reconstructing the input data, our approach eliminates the need for predefined anomaly modeling or extensive labeled training sets.

#Time Series AI #Convolutional Variational Auto Encoder #Deep Learning

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